Cover for Advances in X-ray Spectroscopy

Advances in X-ray Spectroscopy

Contributions in Honour of Professor Y. Cauchois

Book1982

Edited by:

C. BONNELLE and C. MANDÉ

Advances in X-ray Spectroscopy

Contributions in Honour of Professor Y. Cauchois

Book1982

 

Cover for Advances in X-ray Spectroscopy

Edited by:

C. BONNELLE and C. MANDÉ

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Advances in X-Ray Spectroscopy covers topics relevant to the advancement of X-ray spectroscopy technology. The book is a collection of papers written by specialists in X-ray spectr ... read full description

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About the book

Description

Advances in X-Ray Spectroscopy covers topics relevant to the advancement of X-ray spectroscopy technology. The book is a collection of papers written by specialists in X-ray spectroscopy and pays tribute to the scientific work of Prof. Yvette Cauchois. The text is organized into four parts. Part I covers the analysis of X-ray transitions between atomic levels and relativistic theories of X-ray emission satellites and electron BremsStrahlung. Part II reviews the means provided by X-ray spectroscopy for the determination of the electronic structure of solids, while Part III discusses methods of obtaining types of information from X-ray spectra. The fourth part discusses techniques available for studies in the field. Researchers and professionals dealing with X-ray technology will find this book a great source of information regarding its development.

Advances in X-Ray Spectroscopy covers topics relevant to the advancement of X-ray spectroscopy technology. The book is a collection of papers written by specialists in X-ray spectroscopy and pays tribute to the scientific work of Prof. Yvette Cauchois. The text is organized into four parts. Part I covers the analysis of X-ray transitions between atomic levels and relativistic theories of X-ray emission satellites and electron BremsStrahlung. Part II reviews the means provided by X-ray spectroscopy for the determination of the electronic structure of solids, while Part III discusses methods of obtaining types of information from X-ray spectra. The fourth part discusses techniques available for studies in the field. Researchers and professionals dealing with X-ray technology will find this book a great source of information regarding its development.

Details

ISBN

978-0-08-025266-7

Language

English

Published

1982

Copyright

Copyright © 1982 Elsevier Ltd. All rights reserved.

Imprint

Pergamon

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Editors

C. BONNELLE

Université Pierre et Marie Curie, Paris, France

C. MANDÉ

Nagpur University, India